IOM: Analytical Newsletter - Issue 2

Previous Issues Index | Analytical Services

IOM acquires new SEM

Scanning Electron Microscopy (SEM) is a powerful method of imaging very small objects, such as the dusts that may be inhaled into workers' lungs.
The IOM Analytical Laboratory has become the owner of a new Hitachi S2600 SEM with an Oxford INCA X-sight EDXA (Energy Dispersive X-Ray Analysis system).
SEM analysis can be used to examine particles, textures, structures and surface features that are too small to see with ordinary optical microscopes. This information can be combined with the elemental composition data obtained from EDXA to provide a more definitive analysis.


Scanning Electron Microscopy and Asbestos

The SEM is of particular value in identifying and discriminating between traces of asbestos and other types of fibre.

Applications include:

Plus


* We have UKAS Accreditation for these analyses

The IOM has the capability and the experience to provide high quality cost effective electron microscopy analysis. Discounted rates for large numbers of samples. Premium same/next day service available.

For further information, or to discuss your requirements in more detail, please contact:

Steve Clark, Senior Scientific Technician, +44 (0) 131 449 8059
Email: steve.clark@iom-world.org

Carol McIntosh, Laboratory Manager, +44 (0) 131 449 8071
Email: carol.mcintosh@iom-world.org




Chrysotile asbestos in a sample of textured paint magnified 5000X

Chrysotile asbestos in a sample of textured paint magnified 5000X

Airborne dust sample with Amosite (Brown) asbestos magnified 3000X

Airborne dust sample with Amosite (Brown) asbestos magnified 3000X

Wipe sample with chrysotile (White) asbestos magnified 3500X

Wipe sample with chrysotile (White) asbestos magnified 3500X

IOM Headquarters

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